#24-12Computer Vision in Semiconductor Metrology

Addressed topics: Artificial Intelligence, Others

Student Assistance   Master-Thesis  

Are you passionate about developing application-driven computer vision pipelines for semiconductor metrology? Join our team as a student and contribute to the development of computer vision models for analyzing measurements of metrology devices. Our mission is to enhance the efficiency of semiconductor manufacturing by automating image analysis, utilizing web-based user interfaces and simplifying report generation.

Key Responsibilities:

• Develop computer vision models for analyzing metrology measurements.
• Extract meaningful information from metrological data.
• Deploy your pipeline in web-based user interfaces.

Qualifications:

• Strong understanding and practical experience in image processing methods or computer vision models.
• Excellent programming skills (preferably with Python) are required.
• Strong abstract and mathematical thinking skills.
• A strong interest in interdisciplinary work at the intersection of software development, data science, and semiconductor metrology is essential.

We are currently seeking candidates for Master's theses, internships, and student assistant positions.

Please send your application to Dr. Jan Langer.

Don't miss this opportunity to contribute to cutting-edge research in the programmability of heterogeneous compute platforms! Apply now and be part of the Data-Based Methods team at Fraunhofer ENAS.

Contact

Dr. Jan Langer
jan.langer@…