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Center for Micro and Nano Technologies
Project Details
Center for Micro and Nano Technologies 

EU: Optical Characterisation Methods for MEMS Manufacturing - OCMMM


Prof. T. Gessner
GF Messtechnik GmbH (GFM), FhG.IWU, University of Twente-MESA, Thales Avionique (TH-AV), Yole Développement (YOLE), LioniX (LION), Warsaw University of Technology (WUT)
01.01.2001 to 30.06.2004

Optical Characterisation Methods for MEMS Manufacturing